HALT, HASS and HASA Explained: Accelerated Reliability Techniques

HALT and HASS

Design of Halt and Environmental Stress Screening Procedures for High Reliability Electronic Products to Reduce Life Cycle Costs

Reliability is one of the main salient assets of modern electronic systems and its improvement is of utmost importance in manufacturingof high-reliability electronic products. The only possible means of improving the operational characteristics of electronic systems and reducing their overall lifecycle costs is improving their reliability. This is possible through designing in reliability at th...

Reliability Sampling Plans: a Review and Some New Results

In this work we present a large area of aspects related to the problem of sampling inspection in the case of reliability. First we discuss the actual status of this domain, mentioning the newest approaches (from a technical view point) such as HALT and HASS and the statistical perspective. After a brief description of the general procedure in sampling inspection, we offer what we did call here ...

Pitfalls of Accelerated Tests

As product development cycles become shorter, and companies demand more rapid achievement of reliability goals, it is becoming more and more important to use quantitative Accelerated Life Tests (ALT) to predict and improve reliability. Today there is an abundance of methods to plan and analyze accelerated tests, but there are also many pitfalls. This paper identifies some major problems and con...

Highly Accelerated Lifetesting (halt) of Kemet Base-metal- Electrode (bme) Ceramic Chip Capacitors

The ever-growing price of precious metals has promoted the widespread use of nickel and copper in the internal electrodes and end terminations of multilayer ceramic capacitors (MLCCs). While these base metal electrode (BME) capacitors are less expensive than capacitors made with palladium and silver/palladium, their unique production process produces an identifiable wear-out mechanism. Highly a...